Easy To Use Patents Search & Patent Lawyer Directory

At Patents you can conduct a Patent Search, File a Patent Application, find a Patent Attorney, or search available technology through our Patent Exchange. Patents are available using simple keyword or date criteria. If you are looking to hire a patent attorney, you've come to the right place. Protect your idea and hire a patent lawyer.

Searching: texas instruments





Search by keyword, patent number, inventor, assignee, city or state:




Patent # Description
US-7,999,293 Photodiode semiconductor device and manufacturing method
The invention provides a semiconductor device manufactured with a plurality of photodiodes so that it does not short circuit, and includes an opening without...
US-7,998,865 Systems and methods for removing wafer edge residue and debris using a residue remover mechanism
A system (500) removes wafer edge residue from a target wafer (508). A wafer holding mechanism (502) holds and rotates the target wafer (508). A residue remover...
US-7,997,744 Electrically conductive protection layer and a microelectromechanical device using the same
A deformable hinge for use in microelectromechanical devices comprises a protection layer that is electrically conductive. The protection layer is on top of...
US-7,996,740 Adaptor With Clocks For Like Parts of Different Scan Paths
Scan architectures are commonly used to test digital circuitry in integrated circuits. The present disclosure describes a method of adapting conventional scan...
US-7,996,660 Software controlled CPU pipeline protection
A processor in a digital system executes instructions in an instruction execution pipeline. The processor detects a pipeline protection directive while...
US-7,995,640 Dynamic interpolation location
Apparatus and method for optimizing interpolation in the despreader data-path of a wireless telecommunications network employing Code Division Multiple Access...
US-7,995,316 Integrated ESD protection device
An integrated electrostatic discharge (ESD) device includes a first ESD structure coupled to a pad terminal of the integrated ESD device and a second ESD...
US-7,995,279 Color light combiner
For combining light from different light sources that are spatially apart, an optical system comprises a prism assembly that comprises a ...
US-7,995,264 System and method for actuation of spatial light modulators
A system comprises a spatial light modulator comprising a plurality of modulation elements, the spatial light modulator operable to receive an optical signal...
US-7,995,258 Angle diversity antispeckling in spot displays
Improvement of speckling noise is discussed in which a central light beam received at a double-sided mirror is divided into a plurality of sub-beams. An...
US-7,995,144 Optimized phase alignment in analog-to-digital conversion of video signals
A digital video system (2) is disclosed, in which an analog input video signal is sampled at an optimum sample phase (P.sub.nc), and converted to a digital...
US-7,994,819 Level-shifter circuit
One embodiment of the invention includes a level-shifter circuit. The circuit comprises a control stage that steers a current from one of a first control node...
US-7,994,600 Antireflective coating
Device and method for an antireflective coating to improve image quality in an image display system. A preferred embodiment comprises a first high refractive...
US-7,994,073 Low stress sacrificial cap layer
A low stress sacrificial cap layer 120 having a silicon oxide liner film 130, a low stress silicon film 140, and a silicon nitride film. Alternatively, a low...
US-7,993,014 Prism for high contrast projection
Prism elements having TIR surfaces placed in close proximity to the active area of a SLM device to separate unwanted off-state and/or flat-state light from the...
US-7,992,065 Automatic scan format selection based on scan topology selection
A method for specifying a signaling protocol to be used by a controller in a group of controllers connected with shared signaling is provided in which the...
US-7,992,064 Selecting a scan topology
A controller that shares an interface with several other controllers connected in a scan topology in a target system may be selected by receiving a selection...
US-7,992,049 Monitoring of memory and external events
A system comprises a circuit configured to execute instructions and output event data corresponding to the execution of the instructions. The system also...
US-7,991,959 Visualizing contents and states of hierarchical storage systems
An information carrier medium containing software that, when executed by a processor, causes the processor to receive information from circuit logic that is...
US-7,990,916 Cell specific sounding reference signal sub-frame configuration
A method of wireless communication including a plurality of fixed base stations and a plurality of mobile user equipment with each base station transmitting to...
US-7,990,672 Supervision circuit to detect very fast power supply drops
This invention is power supply protection for complex digital circuits employing an external high voltage supply and an internally generated low voltage core...
US-7,990,471 Interlaced-to-progressive video
Interlaced-to-progressive conversion with (1) 3-2 pulldown detection, (2) pre-filtering for field motion detection, (3) field motion detection with feedback,...
US-7,990,188 Clock buffer
An apparatus is provided. The apparatus comprises a first bipolar junction transistor (BJT) differential pair having a first BJT and a second BJT, a second BJT...
US-7,990,074 Adaptive algorithm for camera flash LED power control vs. battery impedance, state of discharge (SOD), aging,...
A method for driving a light-emitting semiconductor is provided. A supply voltage is converted into a secondary output voltage for supplying the light-emitting...
US-7,989,949 Heat extraction from packaged semiconductor chips, scalable with chip area
A semiconductor device (100A) with plastic encapsulation compound (102) and metal sheets (103a and 104) on both surfaces, acting as heat spreaders. One or more...
US-7,989,853 Integration of high voltage JFET in linear bipolar CMOS process
A dual channel JFET which can be integrated in an IC without adding process steps is disclosed. Pinch-off voltage is determined by lateral width of a first,...
US-7,989,232 Method of using electrical test structure for semiconductor trench depth monitor
Embodiments provide a method and device for electrically monitoring trench depths in semiconductor devices. To electrically measure a trench depth, a pinch...
US-7,987,436 Sub-resolution assist feature to improve symmetry for contact hole lithography
A method of making a mask design having optical proximity correction features is provided. The method can include obtaining a target pattern comprising a...
US-7,987,393 Determining operating context of an executed instruction
Determining operating context of an executed instruction. At least some of the illustrative embodiments are a computer-readable medium storing a debug-trace...
US-7,987,014 Systems and methods for selecting wafer processing order for cyclical two pattern defect detection
A method of sequencing wafer processing order to minimize sequence correlation in a cyclical two pattern model by generating a set of sequences of wafer...
US-7,986,566 SRAM cell with read buffer controlled for low leakage current
A functional memory of the integrated circuit includes row and column periphery units and an array of memory cells having a core storage element and a read...
US-7,986,159 Method and apparatus for detecting a cable in a redriver
With conventional redrivers used for external Serial Advanced Technology Attachment (eSATA), there is no ability to indicated to a host that an external device...
US-7,986,010 High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applications
Formation of an electrostatic discharge (ESD) protection device having a desired breakdown voltage (BV) is disclosed. The breakdown voltage (BV) of the device...
US-7,985,990 Transistor layout for manufacturing process control
A symmetrical circuit is disclosed (FIG. 4). The circuit includes a first transistor (220) having a first channel in a substantial shape of a parallelogram...
US-7,985,603 Ferroelectric capacitor manufacturing process
A method of manufacturing a semiconductor device. The method comprises forming conductive and ferroelectric material layers on a semiconductor substrate. The...
US-7,984,393 System and method for making photomasks
The present disclosure is directed a method for preparing photomask patterns. The method comprises receiving drawn pattern data for a design database, the drawn...
US-7,984,352 Saving debugging contexts with periodic built-in self-test execution
A system comprises built-in self-test (BIST) logic configured to perform a BIST, processing logic coupled to the BIST logic and storage logic coupled to the...
US-7,984,349 IC multiplexer control circuitry for tap selection circuitry
Today many instances of IEEE 1149.1 Tap domains are included in integrated circuits (ICs). While all TAP domains may be serially connected on a scan path that...
US-7,984,348 Series equivalent scans across multiple scan topologies
Performing series equivalent scans spanning a plurality of scan technologies in a complex scan topology may be performed by performing shift operations in the...
US-7,984,347 System and method for sharing a communications link between multiple communications protocols
A system and method for sharing a communications link between multiple protocols is described that comprises a system comprising a communications interface...
US-7,984,331 TAM with scan frame copy register coupled with serial output
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The...
US-7,984,319 Memory bus shared system
The invention reduces the pin terminal number of a controller that in parallel or simultaneously accesses a synchronous memory and an asynchronous memory. When...
US-7,984,206 System for debugging throughput deficiency in an architecture using on-chip throughput computations
A method, system, and apparatus for debugging throughput deficiency in an architecture using on-chip throughput computations are disclosed. In one embodiment, a...
US-7,983,375 Variable delay oscillator buffer
A novel and useful variable delay digitally controlled crystal oscillator (DCXO) buffer (i.e. slicer). A conventional slicer following the DCXO is modified to...
US-7,983,071 Dual node access storage cell having buffer circuits
An integrated circuit includes an array of memory cells, each including a core storage element with first and second complementary storage nodes and first and...
US-7,982,827 System and method for dynamically altering a color gamut
System and method for dynamically altering a color gamut used in projection display systems. An embodiment comprises determining a dim color from colors used in...
US-7,982,775 Method and apparatus for motion stabilization
A method and apparatus for digital image stabilization. The method comprises segmenting an exposure time to have multiple partial-exposure images of a scene and...
US-7,982,471 Capacitance measurement system and method
A capacitance measurement system precharges first terminals (21-0 . . . 21-k . . . 21-n) of a plurality of capacitors (25-0 . . . 25-k . . . 25), respectively,...
US-7,982,447 Switched mode power supply having improved transient response
A switched mode power supply has a high side switching transistor coupled between a voltage source and a load for generating the output voltage at the load. A...
US-7,982,438 Method and circuit for controlling the refresh rate of sampled reference voltages
The present invention relates to controlling the refresh rate of the reference voltage on a sampling capacitor (C.sub.samp). A comparator (COMP) compares the...
← Previous | 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 | Next →

File A Patent Application

  • Protect your idea -- Don't let someone else file first. Learn more.

  • 3 Easy Steps -- Complete Form, application Review, and File. See our process.

  • Attorney Review -- Have your application reviewed by a Patent Attorney. See what's included.